发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To stabilize the deposition rate and the film quality when a film is formed on a substrate.SOLUTION: A method includes the steps of: supplying a gas that at least contains an OH group to a substrate in a processing chamber that is set to a first temperature, and thereby, forming a film on the substrate; changing a temperature in the processing chamber from the first temperature to a second temperature higher than the first temperature; and maintaining the inside of the processing chamber at the second temperature in a state where there is no substrate at least in the processing chamber.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016143745(A) |
申请公布日期 |
2016.08.08 |
申请号 |
JP20150017930 |
申请日期 |
2015.01.30 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
NODA TAKAAKI;KONNO KOTARO |
分类号 |
H01L21/314;C23C16/455;C23C16/52;H01L21/31;H01L21/316 |
主分类号 |
H01L21/314 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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