发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A semiconductor device having a substrate including a plurality of external terminals on a rear surface and a plurality of bonding terminals electrically connected to the plurality of external terminals on a front surface, a semiconductor chip mounted on the front surface of the substrate, a surface of the chip including a plurality of bonding pads, a plurality of bonding wires connecting between the plurality of bonding pads or between the plurality of bonding terminals and the plurality of bonding wires respectively, a first sealing layer sealing the front surface of the substrate, the plurality of bonding wires and the semiconductor chip, and a second sealing layer comprised of the same material as the first sealing, the second sealing layer being formed above the first sealing layer. |
申请公布号 |
US9412685(B2) |
申请公布日期 |
2016.08.09 |
申请号 |
US201314099288 |
申请日期 |
2013.12.06 |
申请人 |
J-DEVICES CORPORATION |
发明人 |
Tomonaga Yoshiyuki;Ooida Mitsuru;Watanabe Katsumi;Sato Hidenari |
分类号 |
H01L21/44;H01L23/495;H01L23/31;H01L23/433;H01L21/56;H01L23/00 |
主分类号 |
H01L21/44 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a substrate including a plurality of external terminals on a rear surface and a plurality of bonding terminals electrically connected to the plurality of external terminals on a front surface; a semiconductor chip having a plurality of bonding pads on a surface of the semiconductor chip and mounted on the front surface; a plurality of bonding wires connecting between the plurality of bonding pads or between the plurality of bonding terminals and the plurality of bonding wires respectively; a first encapsulation layer sealing the front surface of the substrate, the plurality of bonding wires and the semiconductor chip; and a second encapsulation layer formed above the first encapsulation layer and attached to the first encapsulation layer, wherein the second encapsulation layer has a higher thermal conductivity than a thermal conductivity of the first encapsulation layer, and a filler of the first encapsulation layer is silica, and a filler of the second encapsulated layer is aluminum or alumina. |
地址 |
Usuki JP |