发明名称 |
Memory device with multiple voltage generators |
摘要 |
A semiconductor memory device includes multiple voltage generators. The memory device includes a first voltage generator for generating a first internal voltage based on a first power supply voltage, and a second voltage generator for generating a second internal voltage based on a second power supply voltage that is lower than the first power supply voltage. The first internal voltage is used as a driving voltage of a bit line sense amplifier in a core block including a memory cell array. The second internal voltage that is lower than the first internal voltage is used as a driving voltage of a peripheral circuit block other than the core block. |
申请公布号 |
US9412429(B2) |
申请公布日期 |
2016.08.09 |
申请号 |
US201414571418 |
申请日期 |
2014.12.16 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Chun Ki-Chul;Park Chul-Sung |
分类号 |
G11C5/14;G11C8/08;G11C8/10;G11C8/12;G11C11/4074;G11C11/4091;G11C11/408 |
主分类号 |
G11C5/14 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A memory device comprising:
a first voltage generator configured to generate a first internal voltage based on a first power supply voltage; a second voltage generator configured to generate a second internal voltage based on a second power supply voltage that is lower than the first power supply voltage; and a core block including a memory cell array and a bit line sense amplifier configured to sense memory cell data in the memory cell array and amplify the sensed memory cell data, wherein the first internal voltage is used as a driving voltage of the bit line sense amplifier in the core block, and the second internal voltage that is lower than the first internal voltage is used as a driving voltage of a peripheral circuit block other than the core block. |
地址 |
Suwon-si, Gyeonggi-do KR |