发明名称 Memory device with multiple voltage generators
摘要 A semiconductor memory device includes multiple voltage generators. The memory device includes a first voltage generator for generating a first internal voltage based on a first power supply voltage, and a second voltage generator for generating a second internal voltage based on a second power supply voltage that is lower than the first power supply voltage. The first internal voltage is used as a driving voltage of a bit line sense amplifier in a core block including a memory cell array. The second internal voltage that is lower than the first internal voltage is used as a driving voltage of a peripheral circuit block other than the core block.
申请公布号 US9412429(B2) 申请公布日期 2016.08.09
申请号 US201414571418 申请日期 2014.12.16
申请人 Samsung Electronics Co., Ltd. 发明人 Chun Ki-Chul;Park Chul-Sung
分类号 G11C5/14;G11C8/08;G11C8/10;G11C8/12;G11C11/4074;G11C11/4091;G11C11/408 主分类号 G11C5/14
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A memory device comprising: a first voltage generator configured to generate a first internal voltage based on a first power supply voltage; a second voltage generator configured to generate a second internal voltage based on a second power supply voltage that is lower than the first power supply voltage; and a core block including a memory cell array and a bit line sense amplifier configured to sense memory cell data in the memory cell array and amplify the sensed memory cell data, wherein the first internal voltage is used as a driving voltage of the bit line sense amplifier in the core block, and the second internal voltage that is lower than the first internal voltage is used as a driving voltage of a peripheral circuit block other than the core block.
地址 Suwon-si, Gyeonggi-do KR