发明名称 Optical tomographic imaging apparatus
摘要 An optical tomographic imaging apparatus includes a first lens, an optical path branching unit, a second lens and a scanning unit disposed on an optical path of measurement light with which an object to be examined is irradiated. The second lens and the scanning unit are disposed in such a manner that an angle at which the measurement light scanned by the scanning unit is incident on the optical path branching unit satisfies a wavelength separation characteristic of 90% or higher at a wavelength of observation light of the object to be examined in a wavelength band of the measurement light.
申请公布号 US9427149(B2) 申请公布日期 2016.08.30
申请号 US201414263818 申请日期 2014.04.28
申请人 Canon Kabushiki Kaisha 发明人 Yoshida Hirofumi
分类号 A61B3/14;A61B3/10;G01B9/02 主分类号 A61B3/14
代理机构 Canon USA Inc., IP Division 代理人 Canon USA Inc., IP Division
主权项 1. An optical tomographic imaging apparatus configured to acquire a tomographic image of an object to be examined based on light generated by combining return light from the object to be examined irradiated by measurement light via a first lens, and reference light corresponding to the measurement light, the optical tomographic imaging apparatus comprising: a scanning unit disposed on an optical path of the measurement light, and configured to scan the measurement light on the object to be examined; a second lens disposed on the optical path of the measurement light between the scanning unit and the first lens; and an optical path branching unit disposed between the first lens and the second lens, and configured to branch from the optical path of the measurement light to an observation optical path for observing the object to be examined, wherein the second lens and the scanning unit are disposed in such a manner that an angle at which the measurement light scanned by the scanning unit is incident on the optical path branching unit satisfies a wavelength separation characteristic of 90% or higher at a wavelength of observation light of the object to be examined in a wavelength band of the measurement light.
地址 Tokyo JP