发明名称 |
Hybrid scan-based delay testing technique for compact and high fault coverage test set |
摘要 |
A scan-based method for testing delay faults in a circuit comprising controlling a subset of state inputs of the circuit by a skewed-load approach and controlling all inputs other than said subset of state inputs by a broad-side approach.
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申请公布号 |
US7313743(B2) |
申请公布日期 |
2007.12.25 |
申请号 |
US20030653959 |
申请日期 |
2003.09.04 |
申请人 |
NEC LABORATORIES AMERICA, INC |
发明人 |
WANG SEONGMOON;LIU XIAO;CHAKRADHAR SRIMAT T. |
分类号 |
G01R31/317;G01R31/316;G01R31/3185;G06K5/04;G11B5/00;G11B20/18;G11B20/20 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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