发明名称 Thin film semiconductor integrated circuit and method of fabricating the same
摘要 In a semiconductor integrated circuit, a plurality of thin film transistors (TFTs) are formed on the same substrate having an insulating surface. Since gate electrodes formed in the TFTs are electrically insulated each other, voltages are applied independently to gate electrodes in an electrolytic solution during an anodization, to form an anodic oxide in at least both sides of each gate electrode. A thickness of the anodic oxide is changed in accordance with characteristics of the TFT. A width of high resistance regions formed in an active layer of each TFT is changed by ion doping using the anodic oxide having a desired thickness as a mask.
申请公布号 US5608251(A) 申请公布日期 1997.03.04
申请号 US19960626578 申请日期 1996.04.02
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KONUMA, TOSHIMITSU;HIROKI, MASAAKI;ZHANG, HONGYONG;YAMAMOTO, MUTSUO;TAKEMURA, YASUHIKO
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/28;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L29/76;H01L27/01;H01L27/13 主分类号 G02F1/136
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