发明名称 Semiconductor integrated circuit device having vertical channel and method of manufacturing the same
摘要 A semiconductor integrated circuit device having a vertical channel and a method of manufacturing the same are provided. A plurality of active lines are formed in a semiconductor substrate. A gate electrode having a lower height than each active line is formed on a sidewall of the active line. A first insulating layer having a height lower than that of the active line and higher than that of the gate electrode is buried between active lines, and a silicide layer is formed on an exposed upper surface and a lateral surface of the active line.
申请公布号 US9425282(B2) 申请公布日期 2016.08.23
申请号 US201414518813 申请日期 2014.10.20
申请人 SK Hynix Inc. 发明人 Choi Kang Sik
分类号 H01L21/336;H01L29/66;H01L29/78 主分类号 H01L21/336
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method of manufacturing a semiconductor integrated circuit device, the method comprising: forming an active line over a semiconductor substrate, the active line including a first sidewall and a second sidewall; forming a first gate electrode over a lower portion of the first sidewall of the active line; forming a second gate electrode over a lower portion of the second sidewall of the active line; forming a first insulating layer between the active line and a neighboring active line to bury the first and the second gate electrodes, wherein an upper portion of the active line is exposed over the first insulating layer; forming a drain region in the upper portion of the active line and forming a common source region extending from the semiconductor substrate under the active line to the semiconductor substrate under the neighboring active line; and forming a silicide layer over an upper surface and a sidewall of the upper portion of the active line, wherein the first and the second gate electrodes are formed to be parallel with the active line.
地址 Gyeonggi-do KR