发明名称 |
Semiconductor integrated circuit device having vertical channel and method of manufacturing the same |
摘要 |
A semiconductor integrated circuit device having a vertical channel and a method of manufacturing the same are provided. A plurality of active lines are formed in a semiconductor substrate. A gate electrode having a lower height than each active line is formed on a sidewall of the active line. A first insulating layer having a height lower than that of the active line and higher than that of the gate electrode is buried between active lines, and a silicide layer is formed on an exposed upper surface and a lateral surface of the active line. |
申请公布号 |
US9425282(B2) |
申请公布日期 |
2016.08.23 |
申请号 |
US201414518813 |
申请日期 |
2014.10.20 |
申请人 |
SK Hynix Inc. |
发明人 |
Choi Kang Sik |
分类号 |
H01L21/336;H01L29/66;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A method of manufacturing a semiconductor integrated circuit device, the method comprising:
forming an active line over a semiconductor substrate, the active line including a first sidewall and a second sidewall; forming a first gate electrode over a lower portion of the first sidewall of the active line; forming a second gate electrode over a lower portion of the second sidewall of the active line; forming a first insulating layer between the active line and a neighboring active line to bury the first and the second gate electrodes, wherein an upper portion of the active line is exposed over the first insulating layer; forming a drain region in the upper portion of the active line and forming a common source region extending from the semiconductor substrate under the active line to the semiconductor substrate under the neighboring active line; and forming a silicide layer over an upper surface and a sidewall of the upper portion of the active line, wherein the first and the second gate electrodes are formed to be parallel with the active line. |
地址 |
Gyeonggi-do KR |