发明名称 FinFETs with multiple threshold voltages
摘要 A device includes a substrate, a semiconductor fin over the substrate, and a gate dielectric layer on a top surface and sidewalls of the semiconductor fin. A gate electrode is spaced apart from the semiconductor fin by the gate dielectric layer. The gate electrode includes a top portion over and aligned to the semiconductor fin, and a sidewall portion on a sidewall portion of the dielectric layer. The top portion of the gate electrode has a first work function, and the sidewall portion of the gate electrode has a second work function different from the first work function.
申请公布号 US9472638(B2) 申请公布日期 2016.10.18
申请号 US201514825665 申请日期 2015.08.13
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Kuo Po-Chin;Lee Hsien-Ming
分类号 H01L29/78;H01L29/49;H01L29/423;H01L29/66;H01L21/28;H01L21/306 主分类号 H01L29/78
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A device comprising: a substrate; a semiconductor fin over the substrate; a gate dielectric layer comprising a top portion overlapping the semiconductor fin, and a sidewall portion on a sidewall of the semiconductor fin; and a first metal layer contacting a top surface of the top portion of the gate dielectric layer, wherein the first metal layer does not extend to sides of the semiconductor fin; and a second metal layer contacting a sidewall of the sidewall portion of the gate dielectric layer, wherein the first metal layer and the second metal layer comprise different materials, and the second metal layer comprises a first portion over and aligned to the semiconductor fin, and second portions extending on the sides of the semiconductor fin.
地址 Hsin-Chu TW