发明名称 |
FinFETs with multiple threshold voltages |
摘要 |
A device includes a substrate, a semiconductor fin over the substrate, and a gate dielectric layer on a top surface and sidewalls of the semiconductor fin. A gate electrode is spaced apart from the semiconductor fin by the gate dielectric layer. The gate electrode includes a top portion over and aligned to the semiconductor fin, and a sidewall portion on a sidewall portion of the dielectric layer. The top portion of the gate electrode has a first work function, and the sidewall portion of the gate electrode has a second work function different from the first work function. |
申请公布号 |
US9472638(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201514825665 |
申请日期 |
2015.08.13 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Kuo Po-Chin;Lee Hsien-Ming |
分类号 |
H01L29/78;H01L29/49;H01L29/423;H01L29/66;H01L21/28;H01L21/306 |
主分类号 |
H01L29/78 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A device comprising:
a substrate; a semiconductor fin over the substrate; a gate dielectric layer comprising a top portion overlapping the semiconductor fin, and a sidewall portion on a sidewall of the semiconductor fin; and a first metal layer contacting a top surface of the top portion of the gate dielectric layer, wherein the first metal layer does not extend to sides of the semiconductor fin; and a second metal layer contacting a sidewall of the sidewall portion of the gate dielectric layer, wherein the first metal layer and the second metal layer comprise different materials, and the second metal layer comprises a first portion over and aligned to the semiconductor fin, and second portions extending on the sides of the semiconductor fin. |
地址 |
Hsin-Chu TW |