发明名称 Super junction LDMOS finFET devices
摘要 A fin-shaped field-effect transistor (finFET) device is provided. The finFET device includes a substrate material with a top surface and a bottom surface. The finFET device also includes a well region formed in the substrate material. The well region may include a first type of dopant. The finFET device also includes a fin structure disposed on the top surface of the substrate material. A portion of the fin structure may include the first type of dopant. The finFET device also includes an oxide material disposed on the top surface of the substrate material and adjacent to the portion of the fin structure. The finFET device also includes a first epitaxial material disposed over a portion of the fin structure. The first epitaxial material may include a second type of dopant.
申请公布号 US9472615(B2) 申请公布日期 2016.10.18
申请号 US201514598119 申请日期 2015.01.15
申请人 Broadcom Corporation 发明人 Zhang Qintao;Ito Akira
分类号 H01L29/00;H01L29/06;H01L29/78;H01L29/66;H01L29/49 主分类号 H01L29/00
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A fin-based field effect transistor (finFET) device, comprising: a substrate material having a top surface and a bottom surface; a first well region formed in the substrate material and comprising a first type of dopant; a first fin structure disposed on the top surface of the substrate material, wherein the first fin structure comprises a first portion and a second portion, the first portion comprising the first type of dopant; an oxide material disposed on the top surface of the substrate material and adjacent to the first portion of the first fin structure; at least one gate structure; and a first epitaxial material disposed over the second portion of the first fin structure, wherein the first epitaxial material comprises a second type of dopant, and wherein the first epitaxial material is adjacent to the at least one gate structure.
地址 Irvine CA US