发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME, AND POWER CONVERSION SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a diode at low cost, which ensures voltage withstanding and excellent in cosmic ray ruggedness and which inhibits an oscillation phenomenon to achieve low noise; and provide a diode manufacturing process in less danger of line contamination.SOLUTION: A semiconductor device comprises: a p type layer 102 provided adjacent to an anode electrode 106 and an n type layer 104 which is adjacent to a cathode electrode 107 and in which a group V element diffuses; an n-drift layer 101 provided between the p type layer 102 and the n type layer 104; and an oxygen-containing n buffer layer 105 which is provided adjacent to the n type layer 104 and continuously across a region of a thickness of 30 μm and over. An n type carrier concentration of the n buffer layer 105 is set higher than an n type carrier concentration of the n-layer 101 and equal to or less than 1×10cm; and an oxygen concentration of the cathode electrode 107 in a region of 30 μm from a surface on the n type layer 104 side is set at not less than 1×10cmand not more than 1×10cm; and an oxygen concentration of the n-layer 101 adjacent to the p type layer 102 is set at less than 1×10cm.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016184713(A) |
申请公布日期 |
2016.10.20 |
申请号 |
JP20150065469 |
申请日期 |
2015.03.27 |
申请人 |
HITACHI LTD;HITACHI POWER SEMICONDUCTOR DEVICE LTD |
发明人 |
WAKAGI MASATOSHI;FURUKAWA TOMOYASU |
分类号 |
H01L29/861;H01L21/329;H01L29/06;H01L29/868 |
主分类号 |
H01L29/861 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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