发明名称 |
Method of improving beta ratio in SRAM and device manufactured thereby |
摘要 |
A method of forming an SRAM transistor cell on a doped semiconductor substrate with a halo region in transistors thereof by the steps including well formation, field isolation formation, threshold voltage implant, gate oxidation; deposition of polysilicon and patterning thereof into gate electrode; post etching anneal; N type LDD photolithography and ion implanting NMOS transistor devices; ion implant halo regions in a transistor; P type LDD photolithography and ion implanting PMOS transistor devices; spacer formation; N+ source/drain photolithography and ion implanting; and P+ source/drain photolithography and ion implanting.
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申请公布号 |
US5872030(A) |
申请公布日期 |
1999.02.16 |
申请号 |
US19970958428 |
申请日期 |
1997.10.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
HUANG, JENN MING |
分类号 |
H01L21/8244;H01L27/11;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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