发明名称 Method of improving beta ratio in SRAM and device manufactured thereby
摘要 A method of forming an SRAM transistor cell on a doped semiconductor substrate with a halo region in transistors thereof by the steps including well formation, field isolation formation, threshold voltage implant, gate oxidation; deposition of polysilicon and patterning thereof into gate electrode; post etching anneal; N type LDD photolithography and ion implanting NMOS transistor devices; ion implant halo regions in a transistor; P type LDD photolithography and ion implanting PMOS transistor devices; spacer formation; N+ source/drain photolithography and ion implanting; and P+ source/drain photolithography and ion implanting.
申请公布号 US5872030(A) 申请公布日期 1999.02.16
申请号 US19970958428 申请日期 1997.10.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG, JENN MING
分类号 H01L21/8244;H01L27/11;(IPC1-7):H01L21/824 主分类号 H01L21/8244
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