发明名称 DETECTION OF NONTRANSIENT PROCESSING ANOMALIES IN VACUUM MANUFACTURING PROCESS
摘要 <p>A sensor, such as a mass spectrometer, capable of detecting the presence of materials in a sampled gas is interconnected with a processing chamber of a vacuum manufacturing tool. The sensor includes a timing circuit which is activated only if certain levels of specific materials are detected. Furthermore, the timer is set to run a predetermined time interval after activation so as to discriminate between known transient processing conditions and the presence of impurities which can greatly influence the manufacturing process. When the timer exceeds the predetermined time duration, an output signal can alert the process operator or automatically shutdown the manufacturing tool.</p>
申请公布号 EP1103071(A4) 申请公布日期 2006.06.14
申请号 EP19990937408 申请日期 1999.07.22
申请人 LEYBOLD INFICON, INC. 发明人 FREES, LOUIS, C.;RIO, VALENTIN
分类号 H01L21/00;H01L21/66;(IPC1-7):H01L21/66;G01R31/26 主分类号 H01L21/00
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