发明名称 METHOD OF TESTING UNLOADED, LARGE-AREA PRINTED CIRCUIT BOARDS WITH A FINGER TESTER
摘要 The invention relates to a method of testing unloaded, large-area printed circuit boards having conductor tracks with a finger tester. According to the method according to the invention, the printed circuit boards (3) are tested when subdivided into a number of segments (I, II, III), conductor tracks (2) that extend beyond one segment being tested by means of capacitive measurement of the end points located in the respective segment, an interruption of the conductor track being established if one measured value of the capacitive measured values belonging to one conductor track differs significantly from other measured values. ® KIPO & WIPO 2008
申请公布号 KR20080025148(A) 申请公布日期 2008.03.19
申请号 KR20087001152 申请日期 2006.05.31
申请人 ATG TEST SYSTEMS GMBH 发明人 YANENKO EVGENY;VOLPERT GILBERT;ROTHAUG UWE
分类号 G01R31/28;G01R31/312 主分类号 G01R31/28
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