METHOD FOR CHARACTERIZING MICROWAVE COMPONENTS

摘要

A method for characterizing microwave components, particularly for calibrating network catalysts for the calibrated measurement of electronic microwave components, which method includes the following processing steps of (A) measuring the scattering coefficients of a number N of calibration standards, which number N of calibration standards is greater than necessary for an analytic determination of calibration parameters to be determined by way of calibration; (B) calculating the calibration parameters dependent on the measured scattering coefficients of the calibration standard. The calculation of the calibration parameters in the processing step B occurs based on an equation system as a function of predetermined Scal-parameters of the calibration standard, and in a processing step C, after the processing step B, a quality criterion of the calibration parameters is determined.

主权项

1. A method for characterizing microwave components, the method comprises the following processing steps:
A measuring scattering coefficients of a number N of calibration standards, said number N of calibration standards is greater than necessary for an analytic determination of calibration parameters that are being determined by the calibration; B calculating the calibration parameters as a function of scattering coefficients of the calibration standards measured, wherein the calculation of the calibration parameters in the processing step B occurs based on an equation system depending on predetermined Scal-parameters of the calibration standards, and C after the processing step B, determining a quality criterion of the calibration parameters.