| 发明名称 |
HIGH IMPEDANCE COMPLIANT PROBE TIP |
| 摘要 |
A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end. |
| 申请公布号 |
US2016187382(A1) |
申请公布日期 |
2016.06.30 |
| 申请号 |
US201414587703 |
申请日期 |
2014.12.31 |
| 申请人 |
Tektronix, Inc. |
发明人 |
Campbell Julie A.;Pollock Ira G.;Hagerup William A.;Enns Christina D. |
| 分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test probe tip, comprising:
a force deflecting assembly; a resistive/impedance element configured to be coupled with the force deflecting assembly, wherein the resistive/impedance element is a round rod resistor; and a tip component configured to be coupled with the resistive/impedance element. |
| 地址 |
Beaverton OR US |
