INTEGRATED CIRCUIT FOR TESTING USING HIGH-SPEED INPUT/OUTPUT INTERFACE

摘要

PROBLEM TO BE SOLVED: To provide systems and methods that help improve the accessibility and/or speed of testing.SOLUTION: An integrated circuit configured for testing is described. The integrated circuit includes a high-speed input/output interface. The integrated circuit also includes a test controller coupled to the high-speed input/output interface. The integrated circuit further includes test circuitry coupled to the test controller. The test controller controls the test circuitry on the basis of controller protocol test information from the high-speed input/output interface.SELECTED DRAWING: Figure 1