发明名称 Metrics for designing a plenoptic imaging system
摘要 Metrics for characterizing the focusing of a plenoptic imaging system. In one aspect, the metric is based on the high frequency content and/or the blurring of the plenoptic image.
申请公布号 US9471728(B2) 申请公布日期 2016.10.18
申请号 US201314022074 申请日期 2013.09.09
申请人 Ricoh Company, Ltd. 发明人 Shroff Sapna A.;Berkner Kathrin;Stork David G.
分类号 G06F17/50;H04N5/232;G02B7/38 主分类号 G06F17/50
代理机构 Fenwick & West LLP 代理人 Fenwick & West LLP
主权项 1. A computer-implemented method for automatically designing a plenoptic imaging system, comprising: accessing a candidate design for the plenoptic imaging system, the plenoptic imaging system comprising a primary imaging subsystem, a secondary imaging array, and a location for a sensor array; simulating a plenoptic image formed by the candidate design; calculating a metric that is a function of the high frequency content in the plenoptic image; and adjusting the candidate design, based on improving the metric in a manner that increases the high frequency content in the plenoptic image; wherein adjusting the candidate design comprises adjusting a distance z2 to position the secondary imaging array at the primary image location of the primary imaging subsystem, wherein z2 is a distance between the primary imaging subsystem and the secondary imaging array, said z2 adjustment based on improving the metric in a manner that increases the high frequency content in the plenoptic image.
地址 Tokyo JP