发明名称 |
Metrics for designing a plenoptic imaging system |
摘要 |
Metrics for characterizing the focusing of a plenoptic imaging system. In one aspect, the metric is based on the high frequency content and/or the blurring of the plenoptic image. |
申请公布号 |
US9471728(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201314022074 |
申请日期 |
2013.09.09 |
申请人 |
Ricoh Company, Ltd. |
发明人 |
Shroff Sapna A.;Berkner Kathrin;Stork David G. |
分类号 |
G06F17/50;H04N5/232;G02B7/38 |
主分类号 |
G06F17/50 |
代理机构 |
Fenwick & West LLP |
代理人 |
Fenwick & West LLP |
主权项 |
1. A computer-implemented method for automatically designing a plenoptic imaging system, comprising:
accessing a candidate design for the plenoptic imaging system, the plenoptic imaging system comprising a primary imaging subsystem, a secondary imaging array, and a location for a sensor array; simulating a plenoptic image formed by the candidate design; calculating a metric that is a function of the high frequency content in the plenoptic image; and adjusting the candidate design, based on improving the metric in a manner that increases the high frequency content in the plenoptic image; wherein adjusting the candidate design comprises adjusting a distance z2 to position the secondary imaging array at the primary image location of the primary imaging subsystem, wherein z2 is a distance between the primary imaging subsystem and the secondary imaging array, said z2 adjustment based on improving the metric in a manner that increases the high frequency content in the plenoptic image. |
地址 |
Tokyo JP |