发明名称 PHOTORESIST TOPCOAT COMPOSITION AND METHOD OF PROCESSING PHOTORESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a topcoat composition exhibiting an improved receding contact angle, which responds to a higher scanning speed on an exposure tool in immersion lithography.SOLUTION: A photoresist topcoat composition is provided, which comprises a first polymer including each repeating unit of specific formulae (I) and (II), a second polymer including each repeating unit of specific formulae (III) and (IV), and a solvent.SELECTED DRAWING: None
申请公布号 JP2016212420(A) 申请公布日期 2016.12.15
申请号 JP20160093572 申请日期 2016.05.09
申请人 ROHM & HAAS ELECTRONIC MATERIALS LLC 发明人 LIU KONG;DORIS H KANG;WANG DEYAN;CHENG BAI SU;LI MINGQI;IRVINDER KAUR
分类号 G03F7/11;C08L33/16;G03F7/004;G03F7/20 主分类号 G03F7/11
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