| 摘要 |
An IC tester and a testing method are provided to obtain high precision data when measuring stable output by obtaining data at high speed in case of measuring changed output of a thin display driver. An IC tester includes a successive approximation type A/D converter(2) and a clock generation unit(4). The successive approximation type A/D converter inputs voltage based on gray-scale output of a thin display driver. The clock generation unit sets a period of a sampling clock shorter when measuring changed output of the thin display driver in comparison when measuring stable output of the thin display driver to give the set period to the successive approximation type A/D converter. The IC tester further includes a difference voltage generation unit to output difference voltage of the output and an expected value of the thin display driver and output the different voltage to the successive approximation type A/D converter. |
