发明名称 PLASMA TREATMENT METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a plasma treatment method capable of working a semiconductor substrate of silicon, group III nitride or the like, and an insulating substrate of glass or the like in the whole surface of the substrate uniformly with high speed. SOLUTION: A rotary electrode 2 having a suction air passage 11 and exhaust passages 12a, 12b is rotated about a rotary axis 3a whereby reactant gas is guided in between the rotary electrode 2 and a workpiece 6, then, is discharged out of the exhaust passages 12a, 12b through the suction air passage 11. The stagnation of the reactant gas can be cleared between the rotary electrode 2 and the workpiece 6 by a simple constitution. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008028023(A) 申请公布日期 2008.02.07
申请号 JP20060196977 申请日期 2006.07.19
申请人 SHARP CORP;MORI YUZO 发明人 FUNAKI TAKESHI;MORI YUZO
分类号 H01L21/3065 主分类号 H01L21/3065
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