发明名称 ATTENUATED TOTAL REFLECTION PROBE AND SPECTROMETER THEREWITH
摘要 An attenuated total reflection probe and a spectrometer having the same are provided to perform spectroscopic analysis on substance having a high absorbance by installing a light source irradiating ultraviolet rays toward the attenuated total reflection probe. An attenuated total reflection probe comprises a prism and a supporter having an opening(12). The prism includes a contact surface(14), which comes in contact with a sample, a light incidence surface(18), and a light emission surface(20). The light incidence surface and the light emission surface do not come in contact with the sample. The support is connected closely to the prism around the opening of the support, so that the contact surface is exposed to the outside. Light passing through the incidence surface enters the contact surface at an incidence angle larger than a critical angle of the prism. The total reflection light passes through the light emission surface by the contact surface.
申请公布号 KR20080082479(A) 申请公布日期 2008.09.11
申请号 KR20080020403 申请日期 2008.03.05
申请人 KURASHIKI BOSEKI KABUSHIKI KAISHA 发明人 HIGASHI NOBORU;OZAKI YUKIHIRO;IKEHATA AKIFUMI
分类号 G01N21/33;G01N21/27;G01N21/552 主分类号 G01N21/33
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