发明名称 PROJECT EXPOSURE DEVICE AND PROJECT EXPOSURE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a project exposure device capable of controlling a variation range in the transmission factor distribution of an illumination unevenness compensation filter that compensates illumination unevenness. <P>SOLUTION: The project exposure device 10 has an exposure optical system that projects a projected pattern formed on a photomask 14 on a substrate 32 on exposure stage 31 with exposure light. In addition, an exposure optical system in the individual project exposure device 10 is provided with a plurality of the illumination unevenness compensation filters 40 having a transmission factor distribution opposite to a proper illumination distribution. A plurality of the illumination unevenness compensation filters 40 are disposed so as to allow transmission factor distributions to be deviated from each other. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008072057(A) 申请公布日期 2008.03.27
申请号 JP20060251478 申请日期 2006.09.15
申请人 NEC LCD TECHNOLOGIES LTD 发明人 SAKUMICHI NORIHIRO
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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