发明名称 METHOD AND STRUCTURE FOR MAKING A TOP-SIDE CONTACT TO A SUBSTRATE
摘要 A method for forming a semiconductor structure includes the following steps. A starting semiconductor substrate having a top-side surface and a back-side surface is provided. A recess is formed in the starting semiconductor substrate through the top-side of the starting semiconductor substrate. A semiconductor material is formed in the recess. A vertically conducting device is formed in and over the semiconductor material, where the starting semiconductor substrate serves as a terminal of the vertically conducting device. A non-recessed portion of the starting semiconductor substrate allows a top-side contact to be made to portions of the starting semiconductor substrate extending beneath the semiconductor material.
申请公布号 KR20090127150(A) 申请公布日期 2009.12.09
申请号 KR20097020520 申请日期 2008.02.29
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 WU CHUN TAI;HO IHSIU
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利