发明名称 |
Insulating trench forming method |
摘要 |
A method of manufacturing an insulating trench including the successive steps of: a) forming, on a semiconductor substrate, a first masking structure including a layer of a first selectively-etchable material and etching a trench into the substrate; b) forming an insulating coating on the trench walls and filling the trench with doped polysilicon; c) forming a silicon oxide plug penetrating into the trench substantially all the way to the upper surface of the substrate and protruding above the upper surface of the substrate; and d) removing the layer of the first material. |
申请公布号 |
US9437674(B2) |
申请公布日期 |
2016.09.06 |
申请号 |
US201514660601 |
申请日期 |
2015.03.17 |
申请人 |
STMICROELECTRONICS (CROLLES 2) SAS |
发明人 |
Ahmed Nayera;Roy François |
分类号 |
H01L29/06;H01L21/762;H01L21/763 |
主分类号 |
H01L29/06 |
代理机构 |
Seed IP Law Group PLLC |
代理人 |
Seed IP Law Group PLLC |
主权项 |
1. A method of manufacturing an insulating trench, the method comprising:
forming a trench having trench walls in a surface of a substrate; covering the trench walls with an insulating material; filling the trench with doped polysilicon; and forming a silicon oxide plug over the polysilicon, an upper surface of the silicon oxide plug located above the surface of the substrate and a lower surface of the silicon oxide plug being substantially at or below the surface of the substrate; and forming an insulator layer on the surface of the substrate and the upper surface of the silicon oxide plug. |
地址 |
Crolles FR |