发明名称 Insulating trench forming method
摘要 A method of manufacturing an insulating trench including the successive steps of: a) forming, on a semiconductor substrate, a first masking structure including a layer of a first selectively-etchable material and etching a trench into the substrate; b) forming an insulating coating on the trench walls and filling the trench with doped polysilicon; c) forming a silicon oxide plug penetrating into the trench substantially all the way to the upper surface of the substrate and protruding above the upper surface of the substrate; and d) removing the layer of the first material.
申请公布号 US9437674(B2) 申请公布日期 2016.09.06
申请号 US201514660601 申请日期 2015.03.17
申请人 STMICROELECTRONICS (CROLLES 2) SAS 发明人 Ahmed Nayera;Roy François
分类号 H01L29/06;H01L21/762;H01L21/763 主分类号 H01L29/06
代理机构 Seed IP Law Group PLLC 代理人 Seed IP Law Group PLLC
主权项 1. A method of manufacturing an insulating trench, the method comprising: forming a trench having trench walls in a surface of a substrate; covering the trench walls with an insulating material; filling the trench with doped polysilicon; and forming a silicon oxide plug over the polysilicon, an upper surface of the silicon oxide plug located above the surface of the substrate and a lower surface of the silicon oxide plug being substantially at or below the surface of the substrate; and forming an insulator layer on the surface of the substrate and the upper surface of the silicon oxide plug.
地址 Crolles FR