MEASURING METHOD AND DEVICE OF QUANTUM EFFICIENCY OF FLUORESCENT MATERIAL

摘要

PROBLEM TO BE SOLVED: To enable the simple and highly accurate measurement of quantum efficiency of fluorescent material by obtaining the amount of incidence,. amount of reflection, and emission spectrum of the fluorescent material at two kinds of dominant wavelengths. SOLUTION: The continuous spectral light of a deutreum lamp 1 is filtered to be irradiation light only with main wavelengths of 254nm and 147nm by an interference filter and is condensed on a silicon diode 2 by a magnesium fluoride 3. A digital multimeter 5 measures the amount of incidence Ein (254) (147) at the location of diode 2 to wavelengths 254nm and 147nm from the output of the diode 2. The diode 2 is arranged on an optical axis in a direction of a reflection angleθ2 =45 deg., and a fluorescent material 9 absorbs the majority of each condensed irradiation light at its surface. The rest of light of diffuse reflection light is partially reflected in a direction of an angle of 45 deg. to enter the diode 2 on the optical axis, and the amount of incidence is each scanned as the amount of incidence Eout (254) (147). In addition, diffused light emission with an emission spectral distribution P(λ) (254) (147) is measured by a multichannel spectroscope 11 via an optical fiber 10.