发明名称 Circuit for measuring signal delays of asynchronous inputs of synchronous elements
摘要 A system measures propagation delays in any number of test circuits, each having two asynchronous inputs and an output, without using their clock inputs to re-initialize the test circuits during measurement operations. The delay between one of the test circuit's asynchronous inputs and its output is measured by propagating a test signal from the one asynchronous input to the output, and the test circuit is re-initialized using the test circuit's other asynchronous input.
申请公布号 US7373560(B1) 申请公布日期 2008.05.13
申请号 US20040008474 申请日期 2004.12.08
申请人 XILINX, INC. 发明人 KINGSLEY CHRISTOPHER H.;BATHALA KUSUMA;DUCE RICHARD D. J.;SWARTZ PAUL A.
分类号 G11B5/00 主分类号 G11B5/00
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