| 发明名称 | Semiconductor device and method for operating the same | ||
| 摘要 | A semiconductor device may include: a plurality of data pads; a plurality of data buffers each suitable for buffering a signal inputted through a first input node using a voltage inputted through a second input node, and outputting the buffered signal; and a calibration control unit suitable for generating a test signal in a calibration mode, adjusting the level of the test signal, receiving outputs of the plurality of data buffers while adjusting the level of the test signal, and adjusting offsets of the data buffers such that the logical values of the outputs of the data buffers transit when the test signal has a target level. | ||
| 申请公布号 | US9361958(B2) | 申请公布日期 | 2016.06.07 |
| 申请号 | US201414523528 | 申请日期 | 2014.10.24 |
| 申请人 | SK Hynix Inc. | 发明人 | Song Choung-Ki |
| 分类号 | G11C7/10;G11C29/50;G11C29/02;G11C11/401 | 主分类号 | G11C7/10 |
| 代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
| 主权项 | 1. A semiconductor device comprising: a plurality of data pads; a plurality of data buffers each suitable for buffering a signal inputted through a first input node using a voltage inputted through a second input node, and outputting the buffered signal; and a calibration control unit suitable for generating a test signal in a calibration mode, adjusting the level of the test signal, receiving outputs of the plurality of data buffers while adjusting the level of the test signal, and adjusting offsets of the data buffers such that the logical values of the outputs of the data buffers transit when the test signal has a target level, wherein data of the corresponding data pad is inputted to the first input node, and a reference voltage is inputted to the second input node, and in the calibration mode, the test signal is inputted to the first input node, and a test voltage is applied to the second input node. | ||
| 地址 | Gyeonggi-do KR | ||