发明名称 IMPACT TESTING DEVICE AND METHOD FOR CALCULATING ADJUSTMENT VALUE OF IMPACT TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method with which it is possible to easily adjust an impact testing machine for obtaining a desired SRS characteristic.SOLUTION: An impact testing device according to the present invention has a flat plate on which a test piece is placed, striking means for striking the flat plate with a pendulum type hammer, and impact analysis means for analyzing an impact from the input waveform of striking and the output waveform of the flat plate. The impact analysis means calculates an SRS, and also performs a simulation in which the impact duration and impact force of an input wave are used as parameters, thereby calculating a target impact duration and a target impact force for obtaining a predetermined SRS. Then, it calculates the adjustment value of the striking means from the obtained target impact duration and target impact force. Using this adjustment value, it is possible to set an impact test condition so as to realize the predetermined SRS.SELECTED DRAWING: Figure 1
申请公布号 JP2016183940(A) 申请公布日期 2016.10.20
申请号 JP20150065387 申请日期 2015.03.27
申请人 NEC CORP 发明人 SUGANO YUUTAI
分类号 G01N3/303;G01M7/08 主分类号 G01N3/303
代理机构 代理人
主权项
地址