发明名称 Gas-based substrate deposition protection
摘要 <p>A platen having a substrate contact supports a substrate during the deposition of tungsten, metal nitrides, other metals, and silicides in a chemical vapor deposition reactor. A deposition control gas composed of a suitable inert gas such as argon or a mixture of inert and reactant gases such as argon and hydrogen is introduced through a restrictive opening into an ambient in the reactor. An exclusion guard is positioned adjacent to the substrate contact and has an extension extending over a frontside peripheral region of the substrate. Deposition control gas is introduced through an opening beneath the exclusion guard extension and exits through a restrictive opening between the exclusion guard extension and a substrate frontside peripheral region. The restrictive opening provides a uniform deposition control gas flow at a pressure greater than reactor ambient pressure and process gas pressure impinging on the frontside of the substrate. Deposition control gas flows uniformly through the restrictive opening across the entire substrate frontside peripheral region, thereby preventing deposition on the substrate edge and backside. &lt;MATH&gt;</p>
申请公布号 EP0698673(A1) 申请公布日期 1996.02.28
申请号 EP19950112510 申请日期 1995.08.09
申请人 NOVELLUS SYSTEMS, INC. 发明人 VAN DE VEN, EVERHARDUS P.;BROADBENT, ELIOT K.;BENZING, JEFFREY C.;CHIN, BARRY L.;BURKHARD, CHRISTOPHER W.;LANE, LAWRENCE C.;MCINERNEY
分类号 C23C16/458;C23C16/04;C23C16/44;C23C16/455;C23C16/54;H01L21/00;H01L21/205;H01L21/28;H01L21/285;H01L21/31;H01L21/683;H01L21/687;(IPC1-7):C23C16/44;C23C16/00 主分类号 C23C16/458
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