发明名称 |
Method for analyzing solid specimen and apparatus therefor |
摘要 |
<p>A method for analyzing a solid specimen comprises the steps of: preparing a pulsed laser beam having a frequency of at least 100 Hz and a half width of 1 mu sec or less; determining a laser irradiation region; irradiating the pulsed laser beam in an inert gas stream and vaporizing a part of the solid specimen to generate fine particles; transferring said fine particles to a detector; and performing elemental analysis in the detector. An apparatus comprises: laser oscillating device including a semiconductor laser; converging device for converging a laser beam; irradiating device for irradiating the converged laser beam to generate fine particles; an analyzer for performing elemental analysis; and transfer device for transferring the fine particles to said analyzer. <IMAGE></p> |
申请公布号 |
EP0831319(A1) |
申请公布日期 |
1998.03.25 |
申请号 |
EP19960120181 |
申请日期 |
1996.12.16 |
申请人 |
NKK CORPORATION |
发明人 |
AKIYOSHI, TAKANORI;SAKASHITA, AKIKO;ISHIBASHI, YOHICHI;MOCHIZUKI, TADASHI;SATO, SHIGEOMI;MAEKAWA, TOSHIYA |
分类号 |
G01N1/00;G01N21/71;(IPC1-7):G01N21/39;G01N1/22;G01J3/00 |
主分类号 |
G01N1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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