发明名称 Circuit and method for testing a memory device
摘要 A voltage generator coupled to a capacitor is provided. In one embodiment, the voltage generator includes an input that receives a control signal that indicates a desired current level output, and further includes circuitry adapted to generate a selected voltage, activate a first current path for an output of the voltage generator when a first current level is desired, and activate a second current path for the output of the voltage generator when a second current level is desired.
申请公布号 US2002093863(A1) 申请公布日期 2002.07.18
申请号 US20020099220 申请日期 2002.03.13
申请人 MICRON TECHNOLOGY, INC. 发明人 CASPER STEPHEN L.
分类号 G11C7/00;G11C11/4074;G11C29/00;G11C29/50;(IPC1-7):G11C29/00 主分类号 G11C7/00
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