发明名称 X-RAY THIN FILM-INSPECTING DEVICE, THIN FILM-INSPECTING DEVICE FOR PRODUCT WAFER AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To make a thin-film inspection operable by incorporating it into a manufacturing process of coating articles, without pulling articles out from a manufacturing line. SOLUTION: The X-ray thin film-inspecting device is equipped with a specimen table 10 arranging test objects, a positioning mechanism 20 moving over the specimen table 10, a goniometer 30 equipped with a first and a second rotating arms 32 and 33, an X-ray irradiating unit 40 that is mounted on the first rotary arm 31 and has built-in X-ray tubes and X-ray optical elements inside a shielding tube, an X-ray detector 50 mounted on the second rotating arm 33, and an optical camera 70 implementing image recognition of the test objects arranged on the specimen table 10. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006153767(A) 申请公布日期 2006.06.15
申请号 JP20040347686 申请日期 2004.11.30
申请人 RIGAKU CORP 发明人 NAKANO ASAO;KINEBUCHI TAKAO;MOTONO HIROSHI;KIKU ATSUNORI
分类号 G01N23/20;G01N23/223;G21K1/06;G21K5/02;H01L21/66 主分类号 G01N23/20
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