| 摘要 |
PROBLEM TO BE SOLVED: To automatically and accurately inspect processed data without complication and regardless of the number of output bits of the processed data. SOLUTION: A test signal output circuit 10 comprises a bit number setting terminal 11 capable of inputting and setting the number N of parallel output bits of a data reception part 21 in a circuit 20A to be inspected; a signal input terminal 12 for inputting, as test input signals, the same clock signals for test as the data reception part 21 in the circuit 20A to be inspected and an expected value comparator circuit 22; a test signal generating circuit 13 for generating serial test patterns (test signals) in such a way that "H" and "L" may be alternately repeated from the high-order bit in each of an N-number of signal lines of the data reception part 21 to any number of output bits and that "H" and "L" may be time-axially (periodically) and alternately repeated in each signal line; and a one-bit differential driver 14 for converting the serial test patterns into serial differential signals and outputting them. COPYRIGHT: (C)2006,JPO&NCIPI
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