发明名称 PROBE FOR MICROSCOPE ANALYSIS, AND MICROSCOPIC ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a probe for microscopic analysis capable of labeling specifically a specific portion of a target molecule in a sample, labeling and analyzing an analysis object without damaging a space resolution of a used microscope, and analyzing localization, the direction (aspect), the shape (stereoscopic structure) and kinetics of the analysis object in the functional state, and a microscopic analysis method using the probe for microscopic analysis. SOLUTION: This probe for microscopic analysis is characterized by having a bar-like structure having a contact part capable of contacting with the specific portion of the microscopic analysis object. This microscopic analysis method is characterized by including at least a process for preparing a sample for microscopic analysis including the probe for microscopic analysis, and a process for detecting the probe for microscopic analysis in the sample for microscopic analysis. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006343207(A) 申请公布日期 2006.12.21
申请号 JP20050168887 申请日期 2005.06.08
申请人 UNIV OF TOKYO 发明人 KATAYAMA EISAKU
分类号 G01N33/566;C12N15/09;C12Q1/68;G01N23/04;G01N23/225;G01N33/532;G01Q60/30;G01Q60/38;G01Q60/42;G01Q70/18;G01Q80/00 主分类号 G01N33/566
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