发明名称 ELECTROSTATIC PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
摘要 An electrostatic protection circuit may include a test pad configured to receive a first signal in a test mode. The electrostatic protection circuit may include a bump array configured to receive a second signal in a normal mode. The electrostatic protection circuit may include a buffer array configured to transmit the first signal or the second signal into a semiconductor device. The electrostatic protection circuit may include an electrostatic protection unit coupled with the test pad and the bump array, and configured to block static electricity included in the first signal and the second signal.
申请公布号 US2016238632(A1) 申请公布日期 2016.08.18
申请号 US201514687012 申请日期 2015.04.15
申请人 SK hynix Inc. 发明人 HONG Nam Pyo
分类号 G01R1/36;G01R31/26 主分类号 G01R1/36
代理机构 代理人
主权项 1. An electrostatic protection circuit comprising: a test pad configured to receive a first signal in a test mode; a bump array configured to receive a second signal in a normal mode; a buffer array configured to transmit the first signal or the second signal into a semiconductor device; and an electrostatic protection unit coupled with the test pad and the bump array, and configured to block static electricity included in the first signal and the second signal.
地址 Icheon-si Gyeonggi-do KR