Method for testing embedded systems

摘要

Functional diagnostic testing of an electronic circuit board assembly with one or more embedded channels to be tested includes steps of: (a) connecting a channel under test; (b) imposing a known digital or analog voltage, as appropriate for a channel under test, that is generated by a digital or analog output of the electronic circuit board assembly; and (c) comparing data read by the channel under test with the stored value of the imposed voltage and required tolerance to determine whether the channel under test is within specifications. Diagnostic test implemented by digital logic and software residing onboard the electronic circuit board assembly. Execution of software or firmware code segment controls the diagnostic test sequence. Signal switching is facilitated by digital and analog multiplexers.

主权项

1. A system for testing an electronic circuit board assembly containing digital logic processing and input and output means that perform diagnostic self-tests on functional characteristics of the electronic circuit board assembly that comprises:
an electronic circuit board containing an integrated circuit configured to provide data processing, data storage, external data communications, and digital input and output functions and analog input and output functions; a first software or firmware code segment configured to provide instructions for diagnostic self-tests residing in the integrated circuit as part of a primary code controlling primary functions of the electronic circuit board assembly; a display to indicate the pass/fail results of the diagnostic self-tests; a digital multiplexer that is controlled by the integrated circuit to switch a source of input signals between internally generated digital test signals and externally generated measurement and control digital input/ output signals; an analog multiplexer that is controlled by the integrated circuit to switch the source of the input signals between internal simulated analog test signals generated by the integrated circuit and externally generated measurement and control analog input and output signals; and a second software or firmware code segment configured to control the switching between internally generated simulated test signals during a diagnostic self-test and externally generated measurement and control signals, and that compares the measured simulated test signals with stored acceptable values of the measured simulated test signals to determine whether a channel of the electronic circuit board being tested is within functional specifications.