发明名称 |
METHOD FOR FABRICATING CMOS IMAGE SENSOR |
摘要 |
A method for manufacturing a CMOS image sensor is provided to bond an external driving circuit and a pad electrode to each other by preventing corrosion of the pad electrode due to a developer in a post-etch process for forming a color filter layer and a microlens. A pixel array part(P) and a logic array part(L) are defined on a semiconductor substrate. An electric wiring is formed on the semiconductor substrate. An interlayer dielectric(161) is formed on a front surface of the semiconductor substrate including the wiring. A pad electrode(153) is formed by depositing and patterning a metal material and an anti-reflection layer(154) on the interlayer dielectric. A protection layer is formed on a front surface of the substrate including the pad electrode. A via hole(172) is formed by removing selectively the protection layer. A color filter layer(140) is formed on the protective layer. A planarization layer(110) is formed to cover the color filter layer. A microlens corresponding to the color filter layer is formed on the planarization layer. The anti-reflection layer is removed from the exposed pad electrode between via holes.
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申请公布号 |
KR20070087854(A) |
申请公布日期 |
2007.08.29 |
申请号 |
KR20050133827 |
申请日期 |
2005.12.29 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LIM, BI O |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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