发明名称 METHOD FOR FABRICATING CMOS IMAGE SENSOR
摘要 A method for manufacturing a CMOS image sensor is provided to bond an external driving circuit and a pad electrode to each other by preventing corrosion of the pad electrode due to a developer in a post-etch process for forming a color filter layer and a microlens. A pixel array part(P) and a logic array part(L) are defined on a semiconductor substrate. An electric wiring is formed on the semiconductor substrate. An interlayer dielectric(161) is formed on a front surface of the semiconductor substrate including the wiring. A pad electrode(153) is formed by depositing and patterning a metal material and an anti-reflection layer(154) on the interlayer dielectric. A protection layer is formed on a front surface of the substrate including the pad electrode. A via hole(172) is formed by removing selectively the protection layer. A color filter layer(140) is formed on the protective layer. A planarization layer(110) is formed to cover the color filter layer. A microlens corresponding to the color filter layer is formed on the planarization layer. The anti-reflection layer is removed from the exposed pad electrode between via holes.
申请公布号 KR20070087854(A) 申请公布日期 2007.08.29
申请号 KR20050133827 申请日期 2005.12.29
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 LIM, BI O
分类号 H01L27/146 主分类号 H01L27/146
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