发明名称 Display in a graphical format of test results generated using scenario models
摘要 A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
申请公布号 US9360523(B2) 申请公布日期 2016.06.07
申请号 US201514689687 申请日期 2015.04.17
申请人 Breker Verification Systems 发明人 Hamid Adnan;Qian Kairong;Do Kieu;Grosse Joerg
分类号 G01R31/3181;G06F3/0484;G06F11/36;G06F17/50;G01R31/3177 主分类号 G01R31/3181
代理机构 Martine Penilla Group, LLP 代理人 Martine Penilla Group, LLP
主权项 1. A method comprising: receiving functionalities of multiple components of a system-on-chip (SoC); generating a graphical layout of the functionalities, the graphical layout including module representations, wherein each of the module representations is associated with a corresponding one of the functionalities; receiving an expected output of the graphical layout; back propagating the expected output from an output node of the graphical layout via two or more of the module representations to generate a stimulus at an input of a portion of the graphical layout, wherein said back propagating is performed to generate a scenario model, wherein the scenario model includes the portion of the graphical layout; and providing the graphical layout with the expected output and the stimulus to a test bench program for performing a test on a design of the SoC.
地址 San Jose CA US