发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MEASURING BATTERY VOLTAGE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and a method for measuring a battery voltage with which it is possible to suppress a measurement error due to parasitic capacitance that occurs in measuring a battery voltage.SOLUTION: There is inputted to a buffer amplifier BAMP1 a voltage on high-voltage side of a battery cell Vc for which a battery voltage is measured. There is inputted to a buffer amplifier BAMP2 a voltage on low-voltage side of a battery cell Vc to be measured other than a battery cell Vc1 at the bottom. When measuring the battery voltage of the battery cell Vc1, a switch SW_G switches the voltage inputted to an amplifier AMP1 from the voltage outputted from the buffer amplifier BAMP2 to a reference voltage VSS. A switch SW0_1 switches the voltage inputted to the buffer amplifier BAMP1 from the voltage on high-voltage side of the battery cell Vc for which a battery voltage is measured to the reference voltage VSS. A semiconductor device 10 is provided with a switch SW0_2 for switching the voltage inputted to the buffer amplifier BAMP2 to the reference voltage VSS.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016121967(A) |
申请公布日期 |
2016.07.07 |
申请号 |
JP20140263050 |
申请日期 |
2014.12.25 |
申请人 |
LAPIS SEMICONDUCTOR CO LTD |
发明人 |
SUGIMURA NAOAKI |
分类号 |
G01R19/00;H01M10/44;H01M10/48;H02J7/02 |
主分类号 |
G01R19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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