| 发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CHECKING OPERATION STATE THEREOF |
| 摘要 |
Disclosed are a semiconductor memory device and a method of checking an operation state thereof. The semiconductor memory device includes: a micro configured to output a data generating code according to a state checking operation command; and a step code generating unit configured to generate a step code for an operation currently performed by a storage device according to the data generating code, and output ROM data including the step code, in which the micro generates a state code for the operation currently performed by the storage device and an operation code for a segmentalized step of the operation according to the ROM data. |
| 申请公布号 |
US2016224413(A1) |
申请公布日期 |
2016.08.04 |
| 申请号 |
US201514792261 |
申请日期 |
2015.07.06 |
| 申请人 |
SK hynix Inc. |
发明人 |
KWON Yong Hyun;PARK Won Sun |
| 分类号 |
G06F11/10;G11C29/52;G11C29/08;G06F11/263 |
主分类号 |
G06F11/10 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor memory device, comprising:
a micro configured to output a data generating code according to a state checking operation command; and a step code generating unit configured to generate a step code for an operation currently performed by a storage device according to the data generating code, and output ROM data including the step code, wherein the micro generates a state code for the operation currently performed by the storage device and an operation code for a segmentalized step of the operation according to the ROM data. |
| 地址 |
Icheon-si Gyeonggi-do KR |
