| 发明名称 |
Content addressable memory with search line test circuitry |
| 摘要 |
A content addressable memory (CAM) and methods of operating a CAM are provided. The method for operating a CAM includes: during a first mode, performing a search function in a CAM bit array, the search result output at a match port of the CAM bit array; and during a second mode, columnwise reading data in the CAM bit array, the read column data output at the match data port of the CAM bit array. The method may include writing the CAM bit array with a predetermined data pattern. The method may further include providing an indication of pass/fail based upon comparing the read column data with expected data. |
| 申请公布号 |
US9418741(B1) |
申请公布日期 |
2016.08.16 |
| 申请号 |
US201514835322 |
申请日期 |
2015.08.25 |
| 申请人 |
Freescale Semiconductor, Inc. |
发明人 |
Ramaraju Ravindraraj;Qureshi Qadeer A.;Spruth Henning F.;Silveira Reinaldo |
| 分类号 |
G11C29/08;G11C15/00;G11C29/12 |
主分类号 |
G11C29/08 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for operating a content addressable memory (CAM), the method comprising:
during a first mode, performing a search function in a CAM bit array (206), the search result output at a match port of the CAM bit array; and during a second mode, columnwise reading data in the CAM bit array, the read column data output at the match data port of the CAM bit array, wherein the columnwise reading data in the CAM bit array uses search logic transistors in a CAM bit cell. |
| 地址 |
Austin TX US |
