发明名称 |
Method of manufacturing a semiconductor device |
摘要 |
A method of manufacturing a semiconductor device, which includes the steps of forming a gate stack structure made up of a floating gate, an inter-poly dielectric, a control gate and a metal layer on a substrate, forming a conformal liner on the gate stack structure, covering a mask layer on the liner, where the mask layer is lower than the metal layer so that a portion of the liner is exposed, and performing a nitridation treatment to transform the exposed liner into a nitrided liner, so that at least the portion of the metal layer in the gate stack structure is covered by the nitrided liner. |
申请公布号 |
US9490349(B1) |
申请公布日期 |
2016.11.08 |
申请号 |
US201514811823 |
申请日期 |
2015.07.28 |
申请人 |
Powerchip Technology Corporation |
发明人 |
Yang Wen-Chung;Yin Te-Yuan;Wang Ssu-Ting |
分类号 |
H01L29/66;H01L21/02;H01L21/033;H01L21/311;H01L21/28 |
主分类号 |
H01L29/66 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
providing a substrate; forming a gate stack structure on the substrate, wherein the gate stack structure includes a floating gate, an inter-poly dielectric, a control gate and a metal layer from bottom to top; forming a liner conformally on the gate stack structure and on the substrate; forming a mask layer on the liner, wherein a top surface of the mask layer is lower than the metal layer of the gate stack structure, so that a portion of the liner is exposed; and performing a nitridation treatment to transform the exposed liner into a nitrided liner, so that at least the portion of the metal layer in the gate stack structure is covered by the nitrided liner. |
地址 |
Hsinchu TW |