APPARATUS AND METHOD FOR ELECTRONIC ANALYSIS OF TEST OBJECTS,申请号EP19880120375-传众专利搜索

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发明名称	APPARATUS AND METHOD FOR ELECTRONIC ANALYSIS OF TEST OBJECTS
摘要
申请公布号	EP0319923(A3)	申请公布日期	1990.09.12
申请号	EP19880120375	申请日期	1988.12.06
申请人	HUNG, YAU Y.	发明人	HUNG, YAU Y.
分类号	G01B11/24;G01B9/02;G01B11/16;G01L1/24;(IPC1-7):G01B11/16	主分类号	G01B11/24
代理机构		代理人
主权项
地址

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