发明名称 CHEMICAL-MECHANICAL POLISHING SYSTEM WITH TEMPERATURE-CONTROLLED POLISHING HEAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical-mechanical polishing system with a temperature-controlled polishing head increasing a polishing speed to improve polishing uniformity. <P>SOLUTION: A chemical-mechanical polishing system is used for polishing a wafer 6. The chemical-mechanical polishing system has a polishing head, an inner tube 16 connected to the polishing head and filled with a heating medium, a medium heating apparatus 20 connected to the inner tube 16, and a pressure control apparatus 18 connected to the inner tube 16. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008177533(A) 申请公布日期 2008.07.31
申请号 JP20070280330 申请日期 2007.10.29
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD 发明人 HWANG JIAN LIN;CHAN CHENG HSUN
分类号 H01L21/304;B24B41/06 主分类号 H01L21/304
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