发明名称 |
METHOD OF FORMING CONDUCTIVE STRUCTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a conductive structure of a semiconductor. SOLUTION: The method includes a process of forming a lower conductive pattern on a semiconductor substrate and after the vapor deposition of a barrier metal film using a metal organic precursor, cleaning the vapor-deposited barrier metal film. It is desirable that the process of cleaning the barrier metal film is carried out using a process gas including a TiCl<SB>4</SB>gas and argon gas at a temperatures between 200°C and 500°C. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2004363583(A) |
申请公布日期 |
2004.12.24 |
申请号 |
JP20040150986 |
申请日期 |
2004.05.20 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
SEO JUNG-HUN;CHOI GIL-HEYUN;LEE JONG-MYEONG;PARK HEE-SOOK |
分类号 |
H01L21/28;H01L21/285;H01L21/321;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/285 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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