发明名称 METHOD OF FORMING CONDUCTIVE STRUCTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a conductive structure of a semiconductor. SOLUTION: The method includes a process of forming a lower conductive pattern on a semiconductor substrate and after the vapor deposition of a barrier metal film using a metal organic precursor, cleaning the vapor-deposited barrier metal film. It is desirable that the process of cleaning the barrier metal film is carried out using a process gas including a TiCl<SB>4</SB>gas and argon gas at a temperatures between 200°C and 500°C. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004363583(A) 申请公布日期 2004.12.24
申请号 JP20040150986 申请日期 2004.05.20
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SEO JUNG-HUN;CHOI GIL-HEYUN;LEE JONG-MYEONG;PARK HEE-SOOK
分类号 H01L21/28;H01L21/285;H01L21/321;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/285 主分类号 H01L21/28
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