AT-SPEED INTERCONNECT TEST CONTROLLER FOR SYSTEM ON CHIP USING MULTIPLE SYSTEM CLOCK AND HAVING HETEROGENEOUS CORES,申请号KR20050016797-传众专利搜索

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发明名称	AT-SPEED INTERCONNECT TEST CONTROLLER FOR SYSTEM ON CHIP USING MULTIPLE SYSTEM CLOCK AND HAVING HETEROGENEOUS CORES
摘要
申请公布号	KR20060095283(A)	申请公布日期	2006.08.31
申请号	KR20050016797	申请日期	2005.02.28
申请人	IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)	发明人	PARK, SUNG JU;JANG, YEON SIL
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
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