发明名称 Method for determining a radiation power and an exposure apparatus
摘要 Method for determining a mean radiation power <maths id="MATH-US-00001" num="00001"> <MATH OVERFLOW="SCROLL"> <MOVER> <MSUBSUP> <MI>P</MI> <MI>rad</MI> <MN>0</MN> </MSUBSUP> <MI>_</MI> </MOVER> </MATH> </MATHS> of electromagnetic radiation of a radiation source, the radiation being intensity-modulated with modulation frequency omega<SUB>0</SUB>, in a predetermined time interval. The method provides a reflector designed to reflect electromagnetic radiation of the radiation source and electromagnetic radiation of a test radiation source, irradiates a predetermined area of the reflector with the source electromagnetic radiation, at least partially irradiates the predetermined area of the reflector with electromagnetic radiation of the test radiation source, measures a omega<SUB>0</SUB>-modulated power component P<SUB>test,omega</SUB><SUB><SUB2>0</SUB2></SUB>(t) of a reflected test radiation power P<SUB>test</SUB>(t) of an electromagnetic radiation of the test radiation source, the radiation being reflected from the area, in the predetermined time interval, determines a mean value <maths id="MATH-US-00002" num="00002"> <MATH OVERFLOW="SCROLL"> <MOVER> <MSUBSUP> <MI>P</MI> <MROW> <MI>test</MI> <MO>,</MO> <MSUB> <MI>omega</MI> <MN>0</MN> </MSUB> </MROW> <MN>0</MN> </MSUBSUP> <MI>_</MI> </MOVER> </MATH> </MATHS> of the measured omega<SUB>0</SUB>-modulated power component P<SUB>test,omega</SUB><SUB><SUB2>0</SUB2></SUB>(t) of the reflected test radiation power P<SUB>test</SUB>(t) in the predetermined time interval, and determines the mean radiation power <maths id="MATH-US-00003" num="00003"> <MATH OVERFLOW="SCROLL"> <MOVER> <MSUBSUP> <MI>P</MI> <MI>rad</MI> <MN>0</MN> </MSUBSUP> <MI>_</MI> </MOVER> </MATH> </MATHS> from the relationship <maths id="MATH-US-00004" num="00004"> <MATH OVERFLOW="SCROLL"> <MROW> <MROW> <MOVER> <MSUBSUP> <MI>P</MI> <MI>rad</MI> <MN>0</MN> </MSUBSUP> <MI>_</MI> </MOVER> <MO>=</MO> <MROW> <MI>a</MI> <MO>.</MO> <MOVER> <MSUBSUP> <MI>P</MI> <MROW> <MI>test</MI> <MO>,</MO> <MSUB> <MI>omega</MI> <MN>0</MN> </MSUB> </MROW> <MN>0</MN> </MSUBSUP> <MI>_</MI> </MOVER> </MROW> </MROW> <MO>,</MO> </MROW> </MATH> </MATHS> where a is a predetermined constant.
申请公布号 US7417736(B2) 申请公布日期 2008.08.26
申请号 US20050599428 申请日期 2005.03.31
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHWARZL SIEGFRIED;WURM STEFAN
分类号 G01J3/00;G01J5/46;G01N21/55;H01L31/00 主分类号 G01J3/00
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