发明名称 RUTHENIUM METAL FEATURE FILL FOR INTERCONNECTS
摘要 A method is provided for at least partially filling a feature in a substrate. The method includes providing a substrate containing a feature, depositing a ruthenium (Ru) metal layer to at least partially fill the feature, and heat-treating the substrate to reflow the Ru metal layer in the feature.
申请公布号 WO2016196937(A1) 申请公布日期 2016.12.08
申请号 WO2016US35724 申请日期 2016.06.03
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON U.S. HOLDINGS, INC. 发明人 YU, Kai-Hung;LEUSINK, Gerrit J.;WAJDA, Cory;ISHIZAKA, Tadahiro;HAKAMATA, Takahiro
分类号 H01L21/28;C23C16/16;C23C16/455;C23C16/46;H01L21/285 主分类号 H01L21/28
代理机构 代理人
主权项
地址