发明名称 |
PHOTOSENSITIVE COMPOSITION |
摘要 |
PURPOSE: To form an image withstanding reactive ion etching with oxygen plasma and having high resolution by using a positive photoresist contg. an organosilicon compd. having quinonediazo groups as terminal groups and a phenolic novolak polymer in a specified ratio. CONSTITUTION: This photoresist contains an organosilicon compd. having quinonediazo groups as terminal groups and a phenolic novolak polymer. The amt. of the organosilicon compd. is about 5-50wt.%, preferably about 10-30wt.% of the total amt. of the organosilicon compd. and the phenolic novolak polymer. An image withstanding dry processing, especially reactive ion etching in oxygen plasma and having high resolution can be formed. |
申请公布号 |
JPH02230249(A) |
申请公布日期 |
1990.09.12 |
申请号 |
JP19890276181 |
申请日期 |
1989.10.25 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
EDOWAADO DAAKO BABIKU;DONIIZU JIYOOJI FURAGERO;MAIKERU HAZAKISU;JIYURII ROSUTOISURABU PARATSUZATSUKU;JIEEN MAAGARETSUTO SHIYAA;DEBUIDO FURANKU UITSUTOMAN |
分类号 |
G03F7/022;G03F7/023;G03F7/039;G03F7/075;H01L21/027 |
主分类号 |
G03F7/022 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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