SEMICONDUCTOR TEST SYSTEM

摘要

PROBLEM TO BE SOLVED: To efficiently test a semiconductor chip. SOLUTION: A chip information acquiring device 103 acquires chip information 102 stored in a semiconductor chip 101, selects a test program corresponding to the acquired chip information 102 out of programs stored in a test program database 104, and loads the selected test program onto a semiconductor tester 105. The semiconductor tester 105 loaded with the test program tests the semiconductor chip 101, based on the test program. COPYRIGHT: (C)2005,JPO&NCIPI